Do we have any more granular information than that these devices are failed? Any electrical power measurements or functional failure information?
The details given is insufficient. Please help to share :
1. What is the failure rate? What is the failure rate vs. tested sample? Example: 2 out of 100 units.
2. What is the failure symptom? Please elaborate the failure symptom in detail.
3. When did the failure happen? How did you discover the failure?
4. How did you determine the failure? Please elaborate the procedures.
5. Does the failure unit ever working before failure?
6. Did they violate solder re-flow temperature profiles, moisture sensitivity? Please provide the re-flow temperature profiles.
7. Did you swap the failure device to a known good board? Is the failure following the device or board?
8. Is this a prototype build or volume/mass production?
9. Kindly provide quantitative investigation result that could proof the failure is Intel FPGA induced.
Please do not share confidential information publicly. If you required private message, please do let us know.
I already closed another similar case 04416508.
Let's discuss both 5SGXMA7N2F45I3N failure case using this forum case.
I will initiate private message discussion with you to follow up on the FA analysis support.