Would like to request reliability information for 10M16SAU169I7G and 10M16SAU324I7G, namely the following details: Assumed activation energy, Ea. Accelerated test junction temp TJ Assumed use condition junction temp TJ Total device test hours. Thanks.
連結已複製
Hello,
Sorry for the delay. Below is the reliability information for 10M16SAU169I7G & 10M16SAU324I7G
Activation Energy : Ea=0.7
If you are looking for junction temperature, kindly refer here:
Hope that answers your question.
Best regards,
Nazrul Naim
Hello,
As we do not receive any response from you on the previous question/reply/answer that we have provided. Please login to ‘https://supporttickets.intel.com’, view details of the desire request, and post a feed/response within the next 15 days to allow me to continue to support you. After 15 days, this thread will be transitioned to community support. The community users will be able to help you on your follow-up questions.
Best regards,
Nazrul Naim
