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BXion2
Beginner
98 Views

EP1S20F484I6N

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Intel bought Altera. Based on CSAM testing what would be the tolerance for "Voids" on these devices? If Void is not within specs, what effective would it have on the device's functions?

Urgent!, If anyone knows please let me know. 

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7 Replies
Victor_G_Intel
Moderator
88 Views

Hello BXion2,


Thank you for posting on the Intel® communities.


Your query will be best answered by our Field programmable array support team. We will help you to move this post to the designated team to further assist you.


Best regards,


Victor G

Intel Customer Support


NurAiman_M_Intel
Employee
65 Views

Hi,


Thank you for contacting Intel community.


Kindly refer to reliability report for further information on quality reliability of the device.

https://www.intel.com/content/dam/www/programmable/us/en/pdfs/literature/rr/rr.pdf


Information for EP1S20F484I6N is limited as the device was obsolete few years back.


Regards,

Aiman


BXion2
Beginner
58 Views

oK it's obselete but the principal is still the same. Remember I don't work at Intel.

I still don't see the "answer" to what is the acceptable "void" for this device?

In percentage or what? After you've reviewed the CSAM results, would this be a

"PASS" by Intel? If it "FAIL", what would cause it? and Would it result in any "Electrical" functions to "FAIL".

Urgent!, I'm running out of time. Wish to close case out ASAP, Many thanks!!

NurAiman_M_Intel
Employee
51 Views

Hi,


Please be noted that I am currently checking this with our internal team. I will get back to you once I received the information.


Regards,

Aiman


NurAiman_M_Intel
Employee
41 Views

Hi,


After further checking with our Quality team, sorry to tell you that we cannot judge by just the CSAM images below whether it will pass/fail “voids” criteria as there are many factors involved that we are not aware of regarding this part to make any judgement.


Regards,

Aiman

 


BXion2
Beginner
35 Views

After reviewing the info provided "Voids" are present on these type of devices but back to my original question, How do you know how much "void" is consider pass or fail? Can the amount of "Void" change over time? If so, what affect will it affect the device?

NurAiman_M_Intel
Employee
21 Views

Hi,


The amount of void should not change over time.

This is ATK’s control for void: Reject - If void > 10% of die size.


Regards,

Aiman