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Kindly refer to reliability report for further information on quality reliability of the device.
Information for EP1S20F484I6N is limited as the device was obsolete few years back.
oK it's obselete but the principal is still the same. Remember I don't work at Intel.
I still don't see the "answer" to what is the acceptable "void" for this device?
In percentage or what? After you've reviewed the CSAM results, would this be a
"PASS" by Intel? If it "FAIL", what would cause it? and Would it result in any "Electrical" functions to "FAIL".
Urgent!, I'm running out of time. Wish to close case out ASAP, Many thanks!!
After further checking with our Quality team, sorry to tell you that we cannot judge by just the CSAM images below whether it will pass/fail “voids” criteria as there are many factors involved that we are not aware of regarding this part to make any judgement.
After reviewing the info provided "Voids" are present on these type of devices but back to my original question, How do you know how much "void" is consider pass or fail? Can the amount of "Void" change over time? If so, what affect will it affect the device?