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EP4CE55F23I7N

Lida8
Beginner
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EP4CE55F23I7N Sample 1  Lot:S112MK80 Date:2113 COO:TW
EP4CE55F23I7N Sample 2  Lot:S002AF25  Date:2001 COO:KR
EP4CE6F17C8N Sample 3 Lot:S042AK5F  Date:2043  COO:KR
Lot:S115AF10  Date:2113  COO:KR
Why does KR origin have secondary coating? Could it be a process issue?
The sample dimensions D, E, A, A2, b and e are all measured to meet the manufacturer's specifications, and the sample appearance is consistent with the drawing. X-ray scanning showed that the internal structure of the sample was consistent, and X-ray did not find any abnormality such as internal voids in the sample.
After dissection and decaps, the samples exhibited consistent wafer profile and identical wafers with the word ALTERA trademark, Z1432, V0026, V0029 and 2009 adopt。
Can you explain it for us?
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AqidAyman_Intel
Employee
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Hi,


Please refer to this EP4CE55F23I7N - Intel Communities for your reference.


Regards,

Aqid Ayman


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