Max V SEU mitigation

[Randrian]

Dear Sirs,

I plan to use MAX V CPLD for an application exposed to ionizing radiation.

Do you have any papers about MAX V SEU testing and results, for both CRAM (configuration RAM) and CFM (configuration flash memory)?

Does the device implement SEU mitigation like CRC or someting else? I will not use TMR (triple modular redundancy) technique.

Best regards,

Randrian

[lixy]

Hi Randrian,

Here's currently no documentation for MAX V SEU mitigation. Also, CRC is not used in MAX V.

If you would like to know the FIT rate for MAX V device, you can log in Resource & Documentation Center (intel.com) with NDA and search for "Reliability Monitoring" report.

Also, there is an "SEU FIT Report" in Quartus, which is license-required .

Thanks & Regards,

Xiaoyan

[Randrian]

Hi Xiaoyan,

For my design, I will replace a MAX II-based old design by MAX V. Could you please confirm if the FIT rate of MAX V device is the same as the FIT of MAX II?

Best regards,

Alexandre

[lixy]

Hi Randrian,

Yes. MAX V and MAX II used the same process technology, so the FIT rates are the same.

Regards,

Xiaoyan

[lixy]

Hi Randrian,

Any further questions?

Xiaoyan

[Randrian]

Hi Xiaoyan,

What about the flash data retention, how many years for 12hours use per day?

Best regards,

Alexandre

[lixy]

Hi Alexandre,

Sorry I could not find this data you mentioned.

There's only "Erase and reprogram cycles" listed in MAX V Datasheet and the reliability monitoring report.

Thanks & Regards,

Xiaoyan

[Randrian]

Hi Xiaoyan,

Could you tell me if the data retention should be the same as Max II?

Best regards,

Alexandre

[WZ2]

Hi Alexandre.

I just further checked documentations. 

The estimated Data Retention hours for MAX II and MAX V are the same, because they used the same FLASH memory process technology. 

Thanks & Regards,