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Is there any way to pull the internally-generated CRC value out of the SEU WYSIWYG atom (Max10)? I'm able to pull the hashed CRC out just fine (0 if the CRCs match, 32 random bits if they don't), but I'd like to be able to pull the full CRC out and handle the comparison myself due to some safety standards I'm required to meet. Is this at all possible?
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Hi Ray,
I would like to clarify if you are looking for the Max 10 SEU FIT report. If yes, you could generate the Max 10 SEU report from Quartus Prime Software by referring to the How-to-Video which will show you how to generate the SEU FIT test report for Max 10 device:
https://www.youtube.com/watch?v=eqcmuwGpGAI
Thank you
Regards,
Chia Ling
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Actually, I'm looking for something more "real-time" than that, a method to pull the CRAM CRC out of the SEU circuitry. I realize that I can check the SEU output to determine if there has been a SEU event, but my requirements are somewhat strict and need an actual, calculated CRC value as my signal output.
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I am sorry to tell you that there is no such features available.
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