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Can the VFB pin or control loop components be measured as part of In-Circuit Testing (ICT) on Enpiri

Mostafa_Intel_AE
Employee
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Can the VFB pin or control loop components be measured as part of In-Circuit Testing (ICT) on Enpirion Power SoC devices?

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Mostafa_Intel_AE
Employee
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The Enpirion® Power SoC device VFB pin and control loop should not be measured as part of In Circuit Testing (ICT) whilst the device is powered and in operation. Depending upon the ICT, parasitic capacitance or inductance may disturb the control loop and cause the device to behave abnormally. Under this condition, damage may occur to the device.

You can infer the behaviour of the device's VFB pin through measurement of the VOUT pins and application of the formula in the respective device datasheet.

It is OK to perform ICT open, short, resistance, and capacitance tests when no power is applied to the Enpirion Power SoC device.

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