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Hi,
In Tiger Lake Design guide 607872 it is mentioned that there are some NCTF pins which can be connected to test points for Solder joint testability. But we can't find complete list of those NCTF pins. In Figure 21 of 607872 some pins are mentioned but not complete list is given any where. Is it okay to connect NCTF pins to test pads?
In Figure 21 of 607872 it is mentioned that pin DW51, DV52, DP53, DV1, DN1, B52, A49, and B2 can be disconnected from ground and can connected to isolated test points. Is it okay to do so?
Waiting for reply.
Regards
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Hello, @Signatics:
Thank you for contacting Intel Embedded Community.
We have sent an email to the address associated with this account with information that may help you.
Best regards,
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