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客户在医疗器件加速器上使用Cyclone V FPGA"s 在验证的过程中, 想要得到一些 官网具体参数的依据,关于单粒子翻转
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Hi,
Thank you for contacting Intel community.
Per my understanding, are you looking for SEU FIT report? Please correct me if i'm wrong.
For SEU FIT rate report, you can generate the report by using Quartus Prime with your Quartus design.
You may refer to youtube link below as it contain the complete step to generate SEU FIT report.
https://www.youtube.com/watch?v=eqcmuwGpGAI
Do inform me if this is not what you are looking for.
Thank you.
Regards,
Aiman
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我的客户需求为 Cyclone V器件在高速和核磁辐射的影响下,芯片内部发生错误的比率 。例如 在多大的辐射影响下 芯片内部传输数据发生多少百分比的错误,类似于这样子的一个Sheet.
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Hi,
Apologize that my previous response did not address your question. Per my understanding, you are referring to Single Event Upset(SEU)? If yes, kindly refer to the link for SEU below:
https://www.intel.com/content/www/us/en/programmable/support/quality-and-reliability/seu.html
Thank you.
Regards,
Aiman

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