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SajjaSiva
Beginner
846 Views

Hi, we are using Cyclone II EP2C50 series FPGAs for one of the control product. We are using CRAM CRC check inbuilt feature for any SEU, It is observed in recent years the CRC errors got increased.

This FPGA is used in module with proper grounded metal casing and controlled environment w.r.t atmosphere (there almost four layers metallic enclosures from sun expose). Really doubt can cosmic rays travel all through and effect the same and also there are other modules sitting next to impacted on with same FPGA chip and configuration). Need to make sure the increased trend in CRC failures are not because of some other controllable causes if they can be any.

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3 Replies
JohnT_Intel
Employee
85 Views

Hi, May I know if this is happening on latest device that you received or this is on the existing device that has been use for a long time? How many device is impacted?
SajjaSiva
Beginner
85 Views

Hi,

This is happening on device, which is in service for years. Almost 50 failures are observed in a span of two years, which are in service for last 10 years to 2 months old installations. Interested to know what are all possible reasons for SEU (FPGA CRAM CRC error), is there any trend shows increase of such failures in recent years (from other Altera Cyclone II chips users).

 

 

Regards,

Sajja.Siva

JohnT_Intel
Employee
85 Views

Hi, There is no trend to show case of such failures. The issue is usually cause by radiation which might be worst during the recent years. You may refer to https://www.intel.com/content/www/us/en/programmable/support/quality-and-reliability/seu.html for more information on the SEU
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